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Self-Testing of Symmetric Three-Qubit States

Authors :
Su-Juan Qin
Xinhui Li
Qiao-Yan Wen
Yukun Wang
Fei Gao
Yun-Guang Han
Source :
IEEE Journal on Selected Areas in Communications. 38:589-597
Publication Year :
2020
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2020.

Abstract

Self-testing refers to a device-independent way to uniquely identify an unknown quantum device based only on the observed statistics. Earlier results on self-testing of multipartite state were restricted either to Dicke states or Graph states. In this paper, we propose self-testing schemes for a large family of symmetric three-qubit states, namely the superposition of $W$ state and $GHZ$ state. We first propose and analytically prove a self-testing criterion for the special symmetric state with equal coefficients of the canonical bases, by designing subsystem self-testing of partially and maximally entangled state simultaneously. Then we demonstrate for the general case, the states can be self-tested numerically by the swap method combining semidefinite programming (SDP) in high precision.

Details

ISSN :
15580008 and 07338716
Volume :
38
Database :
OpenAIRE
Journal :
IEEE Journal on Selected Areas in Communications
Accession number :
edsair.doi...........386507b3bee75cf945805352344bacd9
Full Text :
https://doi.org/10.1109/jsac.2020.2968994