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Abnormal Operating Condition Identification of Industrial Processes Based on Deep Learning With Global-Local Slow Feature Analysis

Authors :
Zhenxiang Feng
Yonggang Li
Bei Sun
Chunhua Yang
Source :
IEEE Transactions on Instrumentation and Measurement. 72:1-11
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects

Subjects :
Electrical and Electronic Engineering
Instrumentation

Details

ISSN :
15579662 and 00189456
Volume :
72
Database :
OpenAIRE
Journal :
IEEE Transactions on Instrumentation and Measurement
Accession number :
edsair.doi...........3a090fcb7aec23787190622b01430408

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Authors Abstract Subjects Details