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Failure Strength Analysis and Young Modulus Assessment of 4H-SiC through a Ball on Ring Test

Authors :
Vincenzo Vinciguerra
Antonio Landi
Herbert Hintermaier
Paolo Badala
Gerald Klug
Alessandro Sitta
Michele Calabretta
Anna Bassi
Marco Renna
Angelo Alberto Messina
Source :
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Accession number :
edsair.doi...........3ac60bd37af77dc71f6e56dda9a367e4
Full Text :
https://doi.org/10.1109/eurosime54907.2022.9758855