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Finite size scaling in the thin film limit
- Source :
- Journal of Applied Physics. 83:7246-7248
- Publication Year :
- 1998
- Publisher :
- AIP Publishing, 1998.
-
Abstract
- The thickness dependent spin-polarized electronic structure of strained thin and ultrathin films of Gd is characterized by a distinct change in the critical exponent λ in the formalism of finite size scaling. The reduced critical exponent in the ultrathin films can be correlated to the increased dominance of the surface magnetic structure and the increasing paramagnetic-like behavior of the bulk.
Details
- ISSN :
- 10897550 and 00218979
- Volume :
- 83
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Physics
- Accession number :
- edsair.doi...........3ae0b5855e2b29dcf7ec660452a8436b
- Full Text :
- https://doi.org/10.1063/1.367909