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Finite size scaling in the thin film limit

Authors :
C. Waldfried
Peter A. Dowben
D. Welipitiya
Elio Vescovo
T. McAvoy
Source :
Journal of Applied Physics. 83:7246-7248
Publication Year :
1998
Publisher :
AIP Publishing, 1998.

Abstract

The thickness dependent spin-polarized electronic structure of strained thin and ultrathin films of Gd is characterized by a distinct change in the critical exponent λ in the formalism of finite size scaling. The reduced critical exponent in the ultrathin films can be correlated to the increased dominance of the surface magnetic structure and the increasing paramagnetic-like behavior of the bulk.

Details

ISSN :
10897550 and 00218979
Volume :
83
Database :
OpenAIRE
Journal :
Journal of Applied Physics
Accession number :
edsair.doi...........3ae0b5855e2b29dcf7ec660452a8436b
Full Text :
https://doi.org/10.1063/1.367909