Towards monomaterial p-n junctions: Single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy

Authors :: Maciej Krzywiecki
Adnan Sarfraz
Andreas Erbe
Source :: Applied Physics Letters. 107:231601
Publication Year :: 2015
Publisher :: AIP Publishing, 2015.
Abstract: The application of a non-destructive method for characterization of electronic structure of an ultra-thin SnO1

Subjects :: Spin coating
Materials science
Physics and Astronomy (miscellaneous)
X-ray photoelectron spectroscopy
Analytical chemistry
Substrate (electronics)
Electronic structure
Electronic band structure
Tin oxide
Stoichiometry
Overlayer

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