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Effects of Annealing on the Interface Properties between Ni and p-GaN

Authors :
Takao Miyajima
Y. Hagio
Takahiro Maruyama
Satoru Kijima
Katsuhiro Akimoto
Yasushi Nanishi
Source :
physica status solidi (a). 188:375-378
Publication Year :
2001
Publisher :
Wiley, 2001.

Abstract

The effects of annealing on the interface properties between p-GaN and Ni were investigated by ultra-violet photoemission spectroscopy. Photoemission spectra of p-GaN showed the existence of oxidized Ga, however, the oxidized Ga disappeared by Ni deposition. In addition, photoemission spectra of Ni/p-GaN after annealing showed the generation of metal-like Ga and the formation of Ni islands. These results indicate that the Ni deposition on GaN and subsequent annealing have an effect of making clean surface of GaN. Such cleaning effect and the island formation may play an important role in ohmic contact formation.

Details

ISSN :
1521396X and 00318965
Volume :
188
Database :
OpenAIRE
Journal :
physica status solidi (a)
Accession number :
edsair.doi...........3e33ab9408c962d7247c6bf26d644143
Full Text :
https://doi.org/10.1002/1521-396x(200111)188:1<375::aid-pssa375>3.0.co;2-9