Methods for the assessment of layer orientation, interface step structure and chemical composition in GaAs/(Al,Ga)As multilayers

Authors :: Chris Boothroyd
W. M. Stobbs
EG Britton
Frances M. Ross
C.S. Baxter
KB Alexander
Source :: Microscopy of Semiconducting Materials, 1987
Publication Year :: 2021
Publisher :: CRC Press, 2021.

Subjects :: Materials science
Interface (Java)
Orientation (graph theory)
Composite material
Chemical composition
Layer (electronics)

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