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Investigation of Contact Potential Variation in Amorphous Silicon Module Interface by Scanning Kelvin Probe Microscopy

Authors :
G. O. Osayemwenre
R. T. Taziwa
E. L. Meyer
Source :
Advanced Science, Engineering and Medicine. 10:870-875
Publication Year :
2018
Publisher :
American Scientific Publishers, 2018.

Subjects

Subjects :
Amorphous silicon
chemistry.chemical_compound
Materials science
chemistry
business.industry
Interface (computing)
Optoelectronics
Scanning kelvin probe microscopy
General Medicine
business

Details

ISSN :
21646627
Volume :
10
Database :
OpenAIRE
Journal :
Advanced Science, Engineering and Medicine
Accession number :
edsair.doi...........3ff4cad3abcc31382781d389c5a4351e
Full Text :
https://doi.org/10.1166/asem.2018.2263
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