High-frequency method of SiC plate crystals characterization

MLA

Vadim Yu. Panevin, et al. “High-Frequency Method of SiC Plate Crystals Characterization.” Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, Feb. 2001. EBSCOhost, https://doi.org/10.1117/12.417637.

APA

Vadim Yu. Panevin, I. E. Titkov, Anatoly V. Shturbin, & Renata F. Witman. (2001). High-frequency method of SiC plate crystals characterization. Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. https://doi.org/10.1117/12.417637

Chicago

Vadim Yu. Panevin, I. E. Titkov, Anatoly V. Shturbin, and Renata F. Witman. 2001. “High-Frequency Method of SiC Plate Crystals Characterization.” Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, February. doi:10.1117/12.417637.