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The antiferromagnetic (AFM) interlayer exchange coupling for sputtered Fe/Si multilayers have been studied by magnetometry, wide-angle neutron diffraction, and spin-polarized neutron reflectometry. Ferromagnetic resonance and Raman scattering measurements have been applied for the characterization of the multilayers. To look for a possible modification of exchange coupling when Si is replaced by Ge, similar Fe/Ge multilayers have been prepared by the same technique. No AFM coupling has been found for Fe/Ge system. Present results differ in part from the literature data and suggest an influence of the sample preparation on the details of its magnetic properties.