Study of the single-event burnout triggering criteria and hardening of the 550 V SOI lateral-IGBT

Authors :: Wangran Wu
Yiwen Qian
Jing Yang
Guangan Yang
Qi Liu
Xiaojuan Xia
Long Zhang
Weifeng Sun
Source :: Microelectronics Reliability. 130:114489
Publication Year :: 2022
Publisher :: Elsevier BV, 2022.

Subjects :: Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials

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