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Challenge of MOS/MTJ-hybrid nonvolatile logic-in-memory architecture in dark-silicon era
- Source :
- 2014 IEEE International Electron Devices Meeting.
- Publication Year :
- 2014
- Publisher :
- IEEE, 2014.
-
Abstract
- In this paper, we present a new architecture-level approach, called “nonvolatile logic-in-memory (NV-LIM) architecture,” to solving performance-wall and power-wall problems due to the present CMOS-only-based logic-LSI processors [1]. Figure 1(a) shows a conventional logic LSI chip architecture, where global interconnections between logic and volatile memory modules dominates performance and power dissipation as well as leakage power continuously consumed by volatile memories. In contrast, since nonvolatile storage elements such as magnetic tunnel junction (MTJ) devices are easily distributed over a logic-circuit plane by using a 3D stack structure as shown in Figure 1(b), performance degradation due to intra-chip global wires can be drastically mitigated, which leads to a high- performance, ultra-low-power and highly reliable (or highly resilient) logic LSI.
- Subjects :
- Engineering
Hardware_MEMORYSTRUCTURES
business.industry
Electrical engineering
Logic family
Dissipation
Tunnel magnetoresistance
Stack (abstract data type)
Memory architecture
Dark silicon
Hardware_INTEGRATEDCIRCUITS
Electronic engineering
business
Hardware_LOGICDESIGN
Volatile memory
Degradation (telecommunications)
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2014 IEEE International Electron Devices Meeting
- Accession number :
- edsair.doi...........423da46a3ab3eed4e610281014dc1123
- Full Text :
- https://doi.org/10.1109/iedm.2014.7047124