Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices

MLA

Jan Vanhellemont, et al. “Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices.” ECS Journal of Solid State Science and Technology, vol. 5, Jan. 2016, pp. P3108–37. EBSCOhost, https://doi.org/10.1149/2.0201604jss.

APA

Jan Vanhellemont, Eddy Simoen, & Eugenijus Gaubas. (2016). Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices. ECS Journal of Solid State Science and Technology, 5, P3108–P3137. https://doi.org/10.1149/2.0201604jss

Chicago

Jan Vanhellemont, Eddy Simoen, and Eugenijus Gaubas. 2016. “Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices.” ECS Journal of Solid State Science and Technology 5 (January): P3108–37. doi:10.1149/2.0201604jss.