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Effect of Strain on Static and Dynamic NBTI of pMOSFETs

Authors :
Chun-Chieh Lin
Hong-Nien Lin
Tiao-Yuan Huang
Chung-Hu Ge
Chih-Hsin Ko
Chien-Chao Huang
Horng-Chih Lin
Source :
Extended Abstracts of the 2004 International Conference on Solid State Devices and Materials.
Publication Year :
2004
Publisher :
The Japan Society of Applied Physics, 2004.

Details

Database :
OpenAIRE
Journal :
Extended Abstracts of the 2004 International Conference on Solid State Devices and Materials
Accession number :
edsair.doi...........45345a72d45e8d392428784a48d5ef64