Observation of Frequency Up-Conversion Gain in SIS Junctions at W Band

We have developed a test setup to measure frequency up-conversion gain in superconductor–insulator–superconductor (SIS) junctions at W band (75–110 GHz). A conventional SIS mixer with Nb/AlOx/Nb tunnel junctions was used as a frequency up-converter. An up-converted signal is measured by a room-temperature down-converter system. We observed distinct intermediate frequency responses to signal inputs from a continuous microwave source. The measured single-sideband up-conversion gain in SIS junctions was clearly positive (> 0 dB) with input frequency less than 2 GHz, which was well-calibrated by using an input from the continuous-wave source.