Back to Search
Start Over
Structural and optical investigations of 120 keV Ag ion implanted ZnO thin films
- Source :
- Thin Solid Films. 653:377-383
- Publication Year :
- 2018
- Publisher :
- Elsevier BV, 2018.
-
Abstract
- Structural as well as optical modifications in zinc oxide (ZnO) thin film with Ag ion implantation were carried out in the present study. The pure ZnO thin films were synthesized by RF-magnetron sputtering technique at room temperature. 120 keV Ag ion beam was used for Ag ion implantation with different implantation dose from 3 × 1014 to 3 × 1016 ions/cm2 by negative ion implantation facility. The thickness and composition of pure ZnO and Ag implanted film at higher dose 3 × 1016 ions/cm2 were estimated by Rutherford backscattering spectroscopy. The change in surface stoichiometry was estimated by using X-ray photoelectron spectroscopy with Ag ion implantation. The modifications in structural features with Ag ion implantation in ZnO films were observed by X-ray diffraction technique (XRD). The pure ZnO thin film was preferentially grown in c-axis direction with crystallite size ~10.6 nm confirmed by XRD. Surface morphology of the pure and Ag implanted ZnO thin films was estimated by atomic force microscopy and revealed the roughness and grain size were increased with increasing the implantation dose. The transmittance of the films was decreased drastically at higher implantation dose as corroborated by UV–visible spectroscopy. Raman spectroscopy of the films was used to understand the lattice defects and disordering during Ag ion implantation. At the higher dose, the film was entirely oriented in c-axis confirmed by X-ray pattern, which can be beneficial for device fabrication.
- Subjects :
- 010302 applied physics
Materials science
Ion beam
Metals and Alloys
Analytical chemistry
02 engineering and technology
Surfaces and Interfaces
021001 nanoscience & nanotechnology
01 natural sciences
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Ion
symbols.namesake
Ion implantation
X-ray photoelectron spectroscopy
Sputtering
0103 physical sciences
Materials Chemistry
symbols
Crystallite
Thin film
0210 nano-technology
Raman spectroscopy
Subjects
Details
- ISSN :
- 00406090
- Volume :
- 653
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........46721d76cab80ab3b377b4d75de3206f