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Surface domain imaging in external magnetic fields

Authors :
G. Steierl
D. Iorgov
G. Liu
Jürgen Kirschner
Source :
Review of Scientific Instruments. 73:4264-4269
Publication Year :
2002
Publisher :
AIP Publishing, 2002.

Abstract

We report on experimental advances in scanning electron microscopy with polarization analysis that allow the observation of ferromagnetic domains in external magnetic fields of about 0.1 T. This is achieved by using a modified electron optics that produces a magnetic field at the sample surface that is spatially confined on the length scale of 0.1 mm. During imaging, primary and secondary electrons pass through the magnetic field without significant disturbance. We demonstrate that the primary electron beam may be used to keep track of the generated magnetic field. As an exemplary application, the switching processes of rectangular Permalloy elements are analyzed.

Details

ISSN :
10897623 and 00346748
Volume :
73
Database :
OpenAIRE
Journal :
Review of Scientific Instruments
Accession number :
edsair.doi...........471305ea15727201ebe8cf3761428f92
Full Text :
https://doi.org/10.1063/1.1520729