A New Thin-Film Permeameter for Measuring All Components of a Permeability Tensor

We describe a new permeameter to evaluate all components of a permeability tensor. The permeameter consists of a shorted microstrip line and a revolving coil, which can operate well up to 300 MHz. All muij r (i, j = x, y, and z) of a relative permeability tensor of a magnetic thin film were evaluated by the permeameter. The measurements show that the sample has large off-diagonal components compared with diagonal ones, indicating that the examination of such off-diagonal components by the permeameter can be used to design new devices with high accuracy.