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Review—Device Assessment of Electrically Active Defects in High-Mobility Materials
- Source :
- ECS Journal of Solid State Science and Technology. 5:P3149-P3165
- Publication Year :
- 2016
- Publisher :
- The Electrochemical Society, 2016.
- Subjects :
- 010302 applied physics
Kelvin probe force microscope
Materials science
business.industry
Infrasound
Strained silicon
02 engineering and technology
Chemical vapor deposition
021001 nanoscience & nanotechnology
Epitaxy
01 natural sciences
Electronic, Optical and Magnetic Materials
0103 physical sciences
Optoelectronics
0210 nano-technology
business
Subjects
Details
- ISSN :
- 21628777 and 21628769
- Volume :
- 5
- Database :
- OpenAIRE
- Journal :
- ECS Journal of Solid State Science and Technology
- Accession number :
- edsair.doi...........48095641325a1e36c258d710e65a1617
- Full Text :
- https://doi.org/10.1149/2.0221604jss