Measuring Techniques for the Semiconductor’s Parameters

MLA

Alessandra Alberti, et al. Measuring Techniques for the Semiconductor’s Parameters. Nov. 2022. EBSCOhost, https://doi.org/10.1007/978-3-030-79827-7_4.

APA

Alessandra Alberti, Filippo Giannazzo, Francesco La Via, Salvatore Lombardo, Antonio M. Mio, Giuseppe Nicotra, Stefania M. S. Privitera, Riccardo Reitano, Fabrizio Roccaforte, Corrado Spinella, & Emanuele Rimini. (2022). Measuring Techniques for the Semiconductor’s Parameters. https://doi.org/10.1007/978-3-030-79827-7_4

Chicago

Alessandra Alberti, Filippo Giannazzo, Francesco La Via, Salvatore Lombardo, Antonio M. Mio, Giuseppe Nicotra, Stefania M. S. Privitera, et al. 2022. “Measuring Techniques for the Semiconductor’s Parameters,” November. doi:10.1007/978-3-030-79827-7_4.