Characterization of seeded sol–Gel lead zirconate titanate thin films

In this paper the electrical properties of PZT (52/48) thin films derived from seeded and unseeded sol–gel precursors are presented. A pure perovskite phase was obtained at lower temperatures, 550°C for 30 min, for film prepared from seeded precursors and deposited on platinum passivated silicon substrates (Pt/Ti/SiO 2 /Si). The electrical properties of these films also reflect the presence or absence of seeds in the precursors. Ferroelectric hysteresis loops began to be observed for seeded films fired at 500°C for 30 min, while in the films derived from unseeded precursors and fired in the same conditions, linear polarization versus electrical field curve is observed.