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Nanoimaging of Orientational Defects in Semiconducting Organic Films
- Source :
- The Journal of Physical Chemistry C. 125:9229-9235
- Publication Year :
- 2021
- Publisher :
- American Chemical Society (ACS), 2021.
-
Abstract
- The development of defect analysis for inorganic semiconductors in the past century paved the way for the success story of today’s electronics. By analogy, defect analysis plays a critical role in ...
- Subjects :
- Materials science
business.industry
Analogy
Nanotechnology
02 engineering and technology
010402 general chemistry
021001 nanoscience & nanotechnology
01 natural sciences
0104 chemical sciences
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
General Energy
Semiconductor
Electronics
Physical and Theoretical Chemistry
0210 nano-technology
business
Subjects
Details
- ISSN :
- 19327455 and 19327447
- Volume :
- 125
- Database :
- OpenAIRE
- Journal :
- The Journal of Physical Chemistry C
- Accession number :
- edsair.doi...........48f558a62383cfdd99d184c8596ee1ef
- Full Text :
- https://doi.org/10.1021/acs.jpcc.1c00059