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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging

Authors :
Jean-Nicolas Audinot
Alexander D Ost
Charlotte Stoffels
Patrick Philipp
Olivier De Castro
Antje Biesemeier
Quang Hung Hoang
Tom Wirtz
Source :
Microscopy and Microanalysis. 28:30-31
Publication Year :
2022
Publisher :
Oxford University Press (OUP), 2022.

Subjects

Subjects :
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
28
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........4932056c8ffe1ad8ca450ca3a040163a
Full Text :
https://doi.org/10.1017/s1431927622001039