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Study on PoP (package-on-package) Assembly Technology

Authors :
Guo Hong Li
Hong Zhen Yang
Xin Yu Cao
Source :
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Publication Year :
2009
Publisher :
IEEE, 2009.

Abstract

This paper analyzes the main factors that affect PoP assembly process quality, and proposes solutions to these problems. The technology is simple, easy-to-use, flexible, and controllable. This technology can make use of the existing SMT equipment, can lower production costs and improve production efficiency and yield.

Details

Database :
OpenAIRE
Journal :
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
Accession number :
edsair.doi...........49b097dcd83cbd6fa0ff7e11d89d64ea