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Atomic Scale Structure and Defects in 2D GaSe Films and Van der Waals Interface

Authors :
Jinwoo Hwang
Sriram Krishnamoorthy
Choong Hee Lee
Siddharth Rajan
Jared M. Johnson
Source :
Microscopy and Microanalysis. 23:1728-1729
Publication Year :
2017
Publisher :
Oxford University Press (OUP), 2017.

Details

ISSN :
14358115 and 14319276
Volume :
23
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........4b11811245053237c3ef8edc63cefa2c
Full Text :
https://doi.org/10.1017/s1431927617009308