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Statistical analysis of apodized array pattern characteristics under spatially correlated error influence
- Source :
- MMET '96. VIth International Conference on Mathematical Methods in Electromagnetic Theory. Proceedings.
- Publication Year :
- 2002
- Publisher :
- IEEE, 2002.
-
Abstract
- It is shown that the array pattern parameters under the influence of spatially correlated errors and distortions can and should be optimized in a statistical sense. The proposed sum-type apodization functions (step-like functions also belong to this class) are able to provide the available trade-off of disturbed pattern characteristics. In particular, the mean maximal side lobe level (MSLL) can be reduced by 1.2 dB even in comparison with the optimal Dolph-Chebyshev and Kaiser-Bessel patterns if the initial MSLL is equal. Heuristic recommendations concerning the apodization function selection for a priori known error correlation characteristics and variance are presented.
Details
- Database :
- OpenAIRE
- Journal :
- MMET '96. VIth International Conference on Mathematical Methods in Electromagnetic Theory. Proceedings
- Accession number :
- edsair.doi...........4c5c4682e2a74ada71790d95f6157055