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Parasitic effects of air-gap through-silicon vias in high-speed three-dimensional integrated circuits
- Source :
- Chinese Physics B. 25:118401
- Publication Year :
- 2016
- Publisher :
- IOP Publishing, 2016.
-
Abstract
- In this paper, ground-signal-ground type through-silicon vias (TSVs) exploiting air gaps as insulation layers are designed, analyzed and simulated for applications in millimeter wave. The compact wideband equivalent-circuit model and passive elements (RLGC) parameters based on the physical parameters are presented with the frequency up to 100 GHz. The parasitic capacitance of TSVs can be approximated as the dielectric capacitance of air gaps when the thickness of air gaps is greater than 0.75 μm. Therefore, the applied voltage of TSVs only needs to achieve the flatband voltage, and there is no need to indicate the threshold voltage. This is due to the small permittivity of air gaps. The proposed model shows good agreement with the simulation results of ADS and Ansoft's HFSS over a wide frequency range.
- Subjects :
- 010302 applied physics
Permittivity
Materials science
business.industry
HFSS
General Physics and Astronomy
020206 networking & telecommunications
02 engineering and technology
Integrated circuit
01 natural sciences
law.invention
Threshold voltage
Parasitic capacitance
law
0103 physical sciences
Extremely high frequency
0202 electrical engineering, electronic engineering, information engineering
Optoelectronics
Air gap (plumbing)
business
Voltage
Subjects
Details
- ISSN :
- 16741056
- Volume :
- 25
- Database :
- OpenAIRE
- Journal :
- Chinese Physics B
- Accession number :
- edsair.doi...........4c75f38818d82141944ffe837603dcdb
- Full Text :
- https://doi.org/10.1088/1674-1056/25/11/118401