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Bayesian sequential estimation of two parameters of a Weibull distribution

Authors :
K. P. Soman
Krishna B. Misra
Source :
Microelectronics Reliability. 34:509-519
Publication Year :
1994
Publisher :
Elsevier BV, 1994.

Abstract

Weibull distribution is one of the most widely used model for failure data in reliability studies. In this paper a sequential estimation procedure for estimating the parameters of Weibull distribution is proposed, which is, in principle similar to Kalman filtering. The main advantage of this approach is that it shows the variation of parameters over a time as new failure data becomes available to the analyst for estimation. Also once an available data has been used, the method does not require that data for further processing as and when the new data becomes available for updating the estimates of parameters. Its use in Quality control asa control chart has been indicated and the procedure is illustrated with the help of examples.

Details

ISSN :
00262714
Volume :
34
Database :
OpenAIRE
Journal :
Microelectronics Reliability
Accession number :
edsair.doi...........4cd7bb4fd7f7131f13a652efcfbee82d
Full Text :
https://doi.org/10.1016/0026-2714(94)90089-2