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Bayesian sequential estimation of two parameters of a Weibull distribution
- Source :
- Microelectronics Reliability. 34:509-519
- Publication Year :
- 1994
- Publisher :
- Elsevier BV, 1994.
-
Abstract
- Weibull distribution is one of the most widely used model for failure data in reliability studies. In this paper a sequential estimation procedure for estimating the parameters of Weibull distribution is proposed, which is, in principle similar to Kalman filtering. The main advantage of this approach is that it shows the variation of parameters over a time as new failure data becomes available to the analyst for estimation. Also once an available data has been used, the method does not require that data for further processing as and when the new data becomes available for updating the estimates of parameters. Its use in Quality control asa control chart has been indicated and the procedure is illustrated with the help of examples.
- Subjects :
- Sequential estimation
Computer science
Estimation theory
Order statistic
Bayesian probability
Kalman filter
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Statistics
Control chart
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Algorithm
Reliability (statistics)
Weibull distribution
Subjects
Details
- ISSN :
- 00262714
- Volume :
- 34
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi...........4cd7bb4fd7f7131f13a652efcfbee82d
- Full Text :
- https://doi.org/10.1016/0026-2714(94)90089-2