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Electronic band structure of gallium nitride: a comparative angle-resolved photoemission study of single crystals and thin films
- Source :
- Surface Science. :223-228
- Publication Year :
- 2002
- Publisher :
- Elsevier BV, 2002.
-
Abstract
- Angle-resolved photoemission measurements on gallium nitride single crystals and epitaxial thin films with wurtzite structure were performed using synchrotron radiation. Calculated theoretical final state bands were used to determine the corresponding k vectors in reciprocal space using the direct transition model. We were able to identify several previously unobserved features including several surface states and transitions to non-free-electron final states. Significant differences in the surface electronic band structure between thin film and single crystal samples were observed. 2002 Elsevier Science B.V. All rights reserved.
- Subjects :
- Chemistry
Wide-bandgap semiconductor
Gallium nitride
Surfaces and Interfaces
Electronic structure
Condensed Matter Physics
Molecular physics
Surfaces, Coatings and Films
Condensed Matter::Materials Science
chemistry.chemical_compound
Crystallography
Reciprocal lattice
Condensed Matter::Superconductivity
Materials Chemistry
Electronic band structure
Single crystal
Surface states
Wurtzite crystal structure
Subjects
Details
- ISSN :
- 00396028
- Database :
- OpenAIRE
- Journal :
- Surface Science
- Accession number :
- edsair.doi...........4df854d2969cd3ac14472416b08c5e77
- Full Text :
- https://doi.org/10.1016/s0039-6028(02)01216-5