Effect of Intense Optical Excitation on Internal Electric Field Evolution in CdTe Gamma-Ray Detectors

The time-of-flight (TOF) transient currents in radiation detectors made of CdTe and Cd0.9Zn0.1Te (CZT) have been measured at several optical excitation intensities to investigate the effect of drifting carriers on the internal field. Both detectors show so-called space-charge-perturbed (SCP) current under intense optical excitation. A Monte Carlo (MC) simulation combined with an iterative solution of Poisson’s equation is used to reproduce the observed currents under several bias voltages and excitation intensities. The SCP theory describes well the transient current in the CZT detector, whereas injection of holes from the anode and a corresponding reduction of the electron lifetime are further required to describe that in the CdTe detector. We visualize the temporal changes in the charge distribution and internal electric field profiles of both detectors.