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Simple Analytical Methods for Determining Optical Constants of Thin Films–Their Application to Amorphous Silicon–

Authors :
Yutaka Hayashi
Isao Sakata
Source :
Japanese Journal of Applied Physics. 20:675
Publication Year :
1981
Publisher :
IOP Publishing, 1981.

Subjects

Subjects :
Amorphous silicon
Materials science
Chemical substance
Spectrometer
business.industry
General Engineering
Nanocrystalline silicon
General Physics and Astronomy
Amorphous solid
chemistry.chemical_compound
chemistry
Absorptance
Optoelectronics
Thin film
business
Science, technology and society

Details

ISSN :
13474065 and 00214922
Volume :
20
Database :
OpenAIRE
Journal :
Japanese Journal of Applied Physics
Accession number :
edsair.doi...........4e74f7c6971a4157ded835624f5fdac5
Full Text :
https://doi.org/10.1143/jjap.20.675
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