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Wavelength Dispersive X-ray Absorption Fine Structure Imaging by Parametric X-ray Radiation

Authors :
Takeshi Sakai
Isamu Sato
M. Inagaki
Toshinari Tanaka
K. Nakao
Ken Hayakawa
Kyoko Nogami
Yasushi Hayakawa
Source :
Japanese Journal of Applied Physics. 47:8081-8086
Publication Year :
2008
Publisher :
IOP Publishing, 2008.

Abstract

The parametric X-ray radiation (PXR) generator system at Laboratory for Electron Beam Research and Application (LEBRA) in Nihon University is a monochromatic and coherent X-ray source with horizontal wavelength dispersion. The energy definition of the X-rays, which depends on the horizontal size of the incident electron beam on the generator target crystal, has been investigated experimentally by measuring the X-ray absorption near edge structure (XANES) spectra on Cu and CuO associated with conventional X-ray absorption imaging technique. The result demonstrated the controllability of the spectrum resolution of XANES by adjusting of the horizontal electron beam size on the target crystal. The XANES spectra were obtained with energy resolution of several eV at the narrowest case, which is in qualitative agreement with the energy definition of the PXR X-rays evaluated from geometrical consideration. The result also suggested that the wavelength dispersive X-ray absorption fine structure measurement associated with imaging technique is one of the promising applications of PXR.

Details

ISSN :
13474065 and 00214922
Volume :
47
Database :
OpenAIRE
Journal :
Japanese Journal of Applied Physics
Accession number :
edsair.doi...........5035a3b340fd3e9b561e6d6b20b8d19b