Chain-based pseudorandom tests for pre-silicon verification of CMP memory systems

MLA

Gabriel A. G. Andrade, et al. “Chain-Based Pseudorandom Tests for Pre-Silicon Verification of CMP Memory Systems.” 2016 IEEE 34th International Conference on Computer Design (ICCD), Oct. 2016. EBSCOhost, https://doi.org/10.1109/iccd.2016.7753340.

APA

Gabriel A. G. Andrade, Luiz C. V. dos Santos, & Marleson Graf. (2016). Chain-based pseudorandom tests for pre-silicon verification of CMP memory systems. 2016 IEEE 34th International Conference on Computer Design (ICCD). https://doi.org/10.1109/iccd.2016.7753340

Chicago

Gabriel A. G. Andrade, Luiz C. V. dos Santos, and Marleson Graf. 2016. “Chain-Based Pseudorandom Tests for Pre-Silicon Verification of CMP Memory Systems.” 2016 IEEE 34th International Conference on Computer Design (ICCD), October. doi:10.1109/iccd.2016.7753340.