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Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored Data

Authors :
Yan Shen
Loon Ching Tang
Min Xie
Source :
IEEE Transactions on Reliability. 59:38-44
Publication Year :
2010
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2010.

Abstract

In this paper, a nonparametric method is proposed for the estimation of decreasing mean residual life with type II censored data. This method is based on the comparison between two estimators of the reliability function: the Kaplan-Meier estimator, and an estimator derived from the empirical MRL function. Simulation results indicate that the new approach is able to give good performance, and can outperform some existing parametric methods when censoring is heavy.

Details

ISSN :
15581721 and 00189529
Volume :
59
Database :
OpenAIRE
Journal :
IEEE Transactions on Reliability
Accession number :
edsair.doi...........534bce295c3758334905dd9fdb2e836b
Full Text :
https://doi.org/10.1109/tr.2010.2040772