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Formulation of Ground States for 2DEG at Rough Surfaces and Application to Nonlinear Model of Surface Roughness Scattering in nMOSFETs
- Source :
- IEEE Journal of the Electron Devices Society. 11:216-229
- Publication Year :
- 2023
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2023.
Details
- ISSN :
- 21686734
- Volume :
- 11
- Database :
- OpenAIRE
- Journal :
- IEEE Journal of the Electron Devices Society
- Accession number :
- edsair.doi...........53e8ed17abae68ef271679a90d045998