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In-Situ TEM Characterization of Nucleation and Growth of Nanopatterned Oxides
- Source :
- Microscopy and Microanalysis. 15:690-691
- Publication Year :
- 2009
- Publisher :
- Oxford University Press (OUP), 2009.
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 15
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........53fb4ab25d6b4a6f8b2558359e0bb280
- Full Text :
- https://doi.org/10.1017/s1431927609096627