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Measurement and comparative analysis of shielding effectiveness of different sputtered materials
- Source :
- 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
- Publication Year :
- 2017
- Publisher :
- IEEE, 2017.
-
Abstract
- Recently, high density integrated circuits are packaged in the electronic devices such as smartphones and smartwatches. Power amplifier modules integrated in such devices interact with other circuits due to its inductive components, and may cause the electromagnetic interference issues. To reduce the electromagnetic issues, sputtering technology can be used. In this paper, we present the shielding effectiveness measurement results of sputtered shielding materials in the low-frequency range from 30 kHz to 20 MHz using a vector network analyzer. Sputtered shielding materials are copper, nickel, titanium and stainless steel. By comparing the insertion loss, the shielding effectiveness is analyzed. The effect of the sputtered materials' thickness is also analyzed. Among the four materials, sputtered copper has the highest shielding effectiveness.
- Subjects :
- Materials science
business.industry
Amplifier
Electrical engineering
020206 networking & telecommunications
02 engineering and technology
Integrated circuit
01 natural sciences
Electromagnetic interference
law.invention
010309 optics
Sputtering
law
0103 physical sciences
Electromagnetic shielding
0202 electrical engineering, electronic engineering, information engineering
Optoelectronics
Insertion loss
Electronics
business
Electronic circuit
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
- Accession number :
- edsair.doi...........551bb62d568089fb8f0858e370c0436b