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Experimental Study of Effect of Crystallite Size Statistics on X‐Ray Diffractometer Intensities

Experimental Study of Effect of Crystallite Size Statistics on X‐Ray Diffractometer Intensities

Authors :
William Parrish
Jeanne M. Taylor
P. M. De Wolff
Source :
Journal of Applied Physics. 30:63-69
Publication Year :
1959
Publisher :
AIP Publishing, 1959.

Abstract

The relative rms deviation σ of the intensity of a rapidly rotating polycrystallite specimen is σ=[6.5R sinθ]/[h(mNeff)½], where R=goniometer radius, θ=Bragg angle, h=(hf+hs)/2, hf=length of focal spot, hs=length of receiving slit, m=multiplicity factor, and Neff the effective number of irradiated crystallites. Experimental data on silicon powder specimens are presented to show the dependence of σ on crystallite sizes, choice of x‐ray wavelengths and various other experimental parameters. Comparisons of data for rapidly rotating and stationary specimens having crystallite sizes in the 30–50 μ range show that rotation improves σ by a factor of 7 or 8 for peak intensities and 4 or 5 for integrated intensities, using a standard diffractometer.

Details

ISSN :
10897550 and 00218979
Volume :
30
Database :
OpenAIRE
Journal :
Journal of Applied Physics
Accession number :
edsair.doi...........55ccdac3f7c659c9a605c4040de322b8
Full Text :
https://doi.org/10.1063/1.1734976