Scanning properties of large dual-shaped offset and symmetric reflector antennas

The scanning properties of shaped reflectors, both offset and circularly symmetric, are examined and compared to conic section scanning characteristics. Scanning of the pencil beam is obtained by lateral and axial translation of a single point source feed. The feed is kept pointed toward the center of the subreflector. The effects of power spillover and aperture phase error as a function beam scanning are examined for several different types of large reflector design including dual-offset, circularly symmetric large f/D, and smaller f/D dual reflector antenna system. It is shown that the Abbe-sine condition for improved scanning of an optical system cannot, inherently, be satisfied in a dual-shaped reflector system that is shaped for high gain and low feed spillover. The gain loss, with scanning, of a high-gain shaped reflector pair is demonstrated to be due to both aperture phase error loss and power spillover loss. >