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Microbeam of 100 keV x ray with a sputtered-sliced Fresnel zone plate

Authors :
Hidekazu Takano
Yoshio Suzuki
Shigeharu Tamura
Nagao Kamijo
Masato Yasumoto
Mitsuhiro Awaji
Akihisa Takeuchi
Source :
Review of Scientific Instruments. 74:5101-5104
Publication Year :
2003
Publisher :
AIP Publishing, 2003.

Abstract

Microfocusing of 100 keV x ray with a sputtered-sliced Fresnel zone plate (ss-FZP) has been performed at the 250-m-long beamline (20XU) of SPring-8. The ss-FZP with an outermost zone width 0.16 μm which is composed of 70 layers of alternating Cu and Al layers and having thickness ∼180 μm was fabricated and characterized. The minimum focal spot size attained for the first order focal beam was 0.5 μm with a focal distance 900 mm at a photon energy 100 keV. The total flux of the microprobe was ∼2×106 photons s−1 μm−2.

Details

ISSN :
10897623 and 00346748
Volume :
74
Database :
OpenAIRE
Journal :
Review of Scientific Instruments
Accession number :
edsair.doi...........57aff87957ce0f26603ee1a7ce12b8fb
Full Text :
https://doi.org/10.1063/1.1614882