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Liquid mediated direct bonding and bond propagation

Authors :
John O'Callaghan
Gerald Beyer
Ingrid De Wolf
Vikas Dubey
Kherim Willems
Jaber Derakhshandeh
Eric Beyne
Kenneth June Rebibis
Andy Miller
Source :
2016 6th Electronic System-Integration Technology Conference (ESTC).
Publication Year :
2016
Publisher :
IEEE, 2016.

Abstract

Room temperature and pressure bonding is shown for wafer-to-wafer (W2W) bonding but never for small chips. Usually, thermo-compression bonding (TCB) is employed for die-to-die (D2D) and die-to-wafer (D2W) bonding for 3D and MEMS application. TCB process is itself limited by tool capability and requires pressure and temperature for bonding which is not only time consuming but can induce coefficient of thermal expansion mismatch and damage to back-end-of-line (BEOL) stacks. To address these issue, we propose a liquid mediated direct bonding approach of inorganic dielectric which can be realized at low temperature and atmospheric pressure using a fast pick and place tool.

Details

Database :
OpenAIRE
Journal :
2016 6th Electronic System-Integration Technology Conference (ESTC)
Accession number :
edsair.doi...........57f692b109ed3aeaacc64cb683525b65
Full Text :
https://doi.org/10.1109/estc.2016.7764501