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Investigation of Performance Degradation in 600-V HD-GITs Under Power Cycling Tests

Authors :
Xu Huang
Pengju Sun
Zhiyuan He
Guoguang Lu
Xiong Du
Quanming Luo
Source :
IEEE Journal of Emerging and Selected Topics in Power Electronics. 11:1111-1120
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects

Subjects :
Energy Engineering and Power Technology
Electrical and Electronic Engineering

Details

ISSN :
21686785 and 21686777
Volume :
11
Database :
OpenAIRE
Journal :
IEEE Journal of Emerging and Selected Topics in Power Electronics
Accession number :
edsair.doi...........58d1ea27495dadeaece85697e95e4da0
Full Text :
https://doi.org/10.1109/jestpe.2022.3213550
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