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Session details: Management of power integrity and circuit reliability

Authors :
Takashi Sato
Source :
Proceedings of the 47th Design Automation Conference.
Publication Year :
2010
Publisher :
ACM, 2010.

Details

Database :
OpenAIRE
Journal :
Proceedings of the 47th Design Automation Conference
Accession number :
edsair.doi...........59769a10dccad1165c14ec2013e429e2
Full Text :
https://doi.org/10.1145/3254451