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Quality Estimation of n-Mono Wafers in Silicon Heterojuction Solar Cells Using Photoluminescence Imaging

Authors :
Shih, Z.-Y.
Chen, F.-S.
Chang, J.
Hsieh, W.-C.
Chen, M.-Y.
Publication Year :
2015
Publisher :
WIP, 2015.

Abstract

31st European Photovoltaic Solar Energy Conference and Exhibition; 884-886<br />Silicon heterojunction (SHJ) solar cells have potential to achieve high efficiencies. Among many process parameters, wafer quality plays an important role in determining the efficiency of a solar cell. The correlation between wafer quality and cell performance was investigated. The wafers in the top, middle, and bottom parts of each ingot were taken and tested. The results from JV-curve measurements revealed that the decreased efficiencies may be due to ambiguous and dark edges of cells shown in photoluminescence imaging, indicating low quality of wafers. After optimizing cell process with a fine quality of wafer, SHJ solar cell on a 6 inch n-mono wafer with a conversion efficiency of 23.43 % was achieved by AUO HJ-RD team.

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi...........597740520e9cb0b242759711159c0119
Full Text :
https://doi.org/10.4229/eupvsec20152015-2bv.8.46