Back to Search
Start Over
No-flow underfill flip chip assembly––an experimental and modeling analysis
No-flow underfill flip chip assembly––an experimental and modeling analysis
- Source :
- Microelectronics Reliability. 42:1205-1212
- Publication Year :
- 2002
- Publisher :
- Elsevier BV, 2002.
-
Abstract
- In the flip-chip assembly process, no-flow underfill materials have a particular advantage over traditional underfill: the application and curing of the former can be undertaken before and during the reflow process. This advantage can be exploited to increase the flip-chip manufacturing throughput. However, adopting a no-flow underfill process may introduce reliability issues such as underfill entrapment, delamination at interfaces between underfill and other materials, and lower solder joint fatigue life. This paper presents an analysis on the assembly and the reliability of flip-chips with no-flow underfill. The methodology adopted in the work is a combination of experimental and computer-modeling methods. Two types of no-flow underfill materials have been used for the flip chips. The samples have been inspected with X-ray and scanning acoustic microscope inspection systems to find voids and other defects. Eleven samples for each type of underfill material have been subjected to thermal shock test and the number of cycles to failure for these flip chips have been found. In the computer modeling part of the work, a comprehensive parametric study has provided details on the relationship between the material properties and reliability, and on how underfill entrapment may affect the thermal–mechanical fatigue life of flip chips with no-flow underfill.
- Subjects :
- Materials science
business.industry
Mechanical engineering
Hardware_PERFORMANCEANDRELIABILITY
Structural engineering
Condensed Matter Physics
Scanning acoustic microscope
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Soldering
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Material properties
business
Flip chip
Subjects
Details
- ISSN :
- 00262714
- Volume :
- 42
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi...........59b46bd00c275cfebdc386242291c10c
- Full Text :
- https://doi.org/10.1016/s0026-2714(02)00092-6