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Demonstration of 3D vertical RRAM with ultra low-leakage, high-selectivity and self-compliance memory cells

Authors :
Ling Li
Jianfeng Gao
Jing Li
Tiancheng Gong
Qing Luo
Shibing Long
Ming Liu
Qi Liu
Nianduan Lu
Haitao Sun
Xiaoxin Xu
Hongtao Liu
Steve S. Chung
Hangbing Lv
Writam Banerjee
Source :
2015 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2015
Publisher :
IEEE, 2015.

Abstract

Developing high performance self-selective cell (SSC) is one of the most critical issues of the integration of 3D vertical RRAM (V-RRAM). In this work, a four-layer V-RRAM array, with high performance HfO2/mixed ionic and electronic conductor (MIEC) bilayer SSC, was demonstrated for the first time. Several salient features were achieved, including ultra-low half-select leakage ( 103), low operation current (nA level), self-compliance, high endurance (>107), and robust read/write disturbance immunity.

Details

Database :
OpenAIRE
Journal :
2015 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........5a2dfa86b34d5a250fddb74ebe47c634