ESD Protection Impact and Modelling of Bias-Dependent Series Resistance in Diodes

Authors :: Jean-Jacques Hajjar
Yuanzhong Paul Zhou
Guanghai Ding
Source :: 2019 41st Annual EOS/ESD Symposium (EOS/ESD).
Publication Year :: 2019
Publisher :: IEEE, 2019.
Abstract: An investigation of different forward-bias and reverse-bias on-resistance in diodes is presented. The impact of this often neglected effect on ESD protection design is demonstrated. A macro-model of a diode has been developed to account for the bias dependent resistance. This has been used in SPICE-type circuit level ESD simulation.

Subjects :: Materials science
Equivalent series resistance
business.industry
Breakdown voltage
Optoelectronics
business
Diode

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