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Vibrational electron energy loss spectroscopy of the Si(111)(7×7)–H2O(D2O) system

Authors :
Shin-ichiro Tanaka
K. Edamoto
Mitsuaki Nishijima
Y. Kubota
M. Onchi
Source :
The Journal of Chemical Physics. 84:6458-6465
Publication Year :
1986
Publisher :
AIP Publishing, 1986.

Abstract

High‐resolution electron energy loss spectroscopy (EELS) has been applied to the study of the Si(111)(7×7)–H2O(D2O) system. At 300 K, H2O(D2O) is partially dissociated on the Si(111) surface to form the SiOH(SiOD) and SiH(SiD) species. Angle and primary‐electron‐energy dependences of the vibrational loss intensities were measured. Relative contributions to the vibrational excitations of the dipole, impact, and resonance mechanisms were estimated. The O–H(O–D) stretching and Si–O–H (Si–O–D) bending vibrations are partly excited by the resonance mechanism in the primary energy region of Ep ≂2–7 eV. EELS spectra of the Si(111) surface exposed to H2O(D2O) at 300 K and of the same surface heated to ∼700–900 K are presented, and surface reaction mechanisms are discussed.

Details

ISSN :
10897690 and 00219606
Volume :
84
Database :
OpenAIRE
Journal :
The Journal of Chemical Physics
Accession number :
edsair.doi...........5c7af60c09bda36e708413a828f857f1
Full Text :
https://doi.org/10.1063/1.450741