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A novel and simple pulsed dc bias test system for power amplifier
- Source :
- 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.
- Publication Year :
- 2006
- Publisher :
- IEEE, 2006.
-
Abstract
- A novel and simple pulse Dc bias test system has been established to emulate an isothermal environment for on-wafer characterization of MMIC power amplifiers. Testing results of a Ka band monolithic power amplifier with pulse dc bias show a power output capacity increase of 1.5-2dBm at the frequency of 33GHz
Details
- Database :
- OpenAIRE
- Journal :
- 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings
- Accession number :
- edsair.doi...........5d8a235b8937b30d7400528ff18f3b0a