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Doping of graphene for the application in nano-interconnect
- Source :
- Microelectronic Engineering. 167:42-46
- Publication Year :
- 2017
- Publisher :
- Elsevier BV, 2017.
-
Abstract
- Graphene is considered as potential candidate for future nano-interconnects. In this respect we study the Bronsted acid doping effect of single layer graphene (SLG) and few layer graphene (FLG) synthesized by chemical vapor deposition (CVD). A sheet resistance reduction of 50% is achieved by HNO3 doping of SLG, and the resulting resistivity of 9.1µźźcm is comparable to alternative metals to copper (e.g. Ru). On the other hand, synthetic FLG shows higher sheet resistance due to higher defect density. Mobility degradation at increased carrier concentration is a main limiting factor for sheet resistance reduction of CVD graphene. Display Omitted Doping of graphene with acids can efficiently increase hole concentration through charge transfer process.Resistivity comparable to BEOL metals (e.g. Ru) can be achieved by doping CVD single-layer graphene.Mobility degradation after doping is observed for both single-layer graphene and few-layer graphene.A combination of long range and short range scattering can explain the mobility behavior of single-layer graphene.Doped CVD few-layer graphene shows lower mobility and higher sheet resistance than single-layer graphene.
- Subjects :
- Materials science
Nanotechnology
02 engineering and technology
Chemical vapor deposition
010402 general chemistry
01 natural sciences
law.invention
Electrical resistivity and conductivity
law
Nano
Electrical and Electronic Engineering
Sheet resistance
Graphene oxide paper
business.industry
Graphene
Doping
technology, industry, and agriculture
021001 nanoscience & nanotechnology
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
0104 chemical sciences
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Optoelectronics
0210 nano-technology
business
Graphene nanoribbons
Subjects
Details
- ISSN :
- 01679317
- Volume :
- 167
- Database :
- OpenAIRE
- Journal :
- Microelectronic Engineering
- Accession number :
- edsair.doi...........5db323548e71768b358a89f8e299161e
- Full Text :
- https://doi.org/10.1016/j.mee.2016.10.013